DocumentCode
1056834
Title
The n+-IPOS scheme and its applications to IC´s
Author
Arita, Y. ; Kato, K. ; Sudo, T.
Author_Institution
Nippon Telegraph and Telephone Public Corporation, Musashino-shi, Tokyo, Japan
Volume
24
Issue
6
fYear
1977
fDate
6/1/1977 12:00:00 AM
Firstpage
756
Lastpage
757
Abstract
The n+-IPOS scheme, a new isolation technique, has been developed and applied to fabricate integrated circuits. A propagation delay of 105 ps/gate has been obtained for an NTL circuit fabricated using this scheme.
Keywords
Charge carrier processes; Circuits; Electron emission; Epitaxial layers; Impurities; Lighting; Oxidation; Propagation delay; Silicon; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18816
Filename
1479008
Link To Document