• DocumentCode
    10576
  • Title

    Silicon Carbide Integrated Circuits With Stable Operation Over a Wide Temperature Range

  • Author

    Ghandi, Reza ; Cheng-Po Chen ; Liang Yin ; Xingguang Zhu ; Liangchun Yu ; Arthur, Stephen ; Ahmad, Farhan ; Sandvik, Peter

  • Author_Institution
    GE Global Res. Center, Schenectady, NY, USA
  • Volume
    35
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    1206
  • Lastpage
    1208
  • Abstract
    In this letter, silicon carbide MOSFET-based integrated circuits have been designed, fabricated, and successfully tested from -193 °C (80 K) to 500 °C. Silicon carbide single MOSFETs remained fully operational over a 700-°C wide temperature range and exhibited stable I-V characteristics. The circuits that include operational amplifier (op-amp), 27-stage ring oscillator, and buffer were tested and shown to be functional up to 500 °C with relatively small performance variation between 300 °C and 500 °C. High-temperature evaluation of these circuits confirmed stable operation and survivability of both the ring oscillator and op-amp for more than 100 h at 500 °C.
  • Keywords
    MOSFET; buffer circuits; operational amplifiers; oscillators; silicon compounds; wide band gap semiconductors; 27-stage ring oscillator; SiC; buffer; high-temperature evaluation; op-amp; operational amplifier; silicon carbide integrated circuits; single MOSFET; stable I-V characteristics; stable operation; temperature -193 degC to 500 degC; wide temperature range; High-temperature techniques; Integrated circuits; MOSFET; Ring oscillators; Silicon carbide; Silicon carbide; high temperature electronics; high temperature electronics.; integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2362815
  • Filename
    6936289