Title :
Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems
Author :
Nakano, Yoshinori ; Sudo, Hiromi ; Iwane, Genzo ; Matsumoto, Tadashi ; Ikegami, Tetsuhiko
Author_Institution :
Atsugi Electrical Communication Laboratory, NTT, Ono, Atsugi-shi, Kanagawa, Japan
fDate :
11/1/1984 12:00:00 AM
Abstract :
This paper reports the strategy for establishing the reliability assurance for LD´s and APD´s available for undersea transmission systems. On the basis of aging data during more than 104h and a statistical analysis for the reliability of semiconductor devices, the LD´s and Ge-APD´s lifetest plans for high reliability assurance are proposed.
Keywords :
Communication system reliability; Optical fiber receivers; Optical fiber transmitters, lasers; Underwater optical fiber systems; Aging; Detectors; Oceans; Optical devices; Optical fiber cables; Repeaters; Semiconductor device reliability; Semiconductor devices; Semiconductor lasers; Statistical analysis;
Journal_Title :
Selected Areas in Communications, IEEE Journal on
DOI :
10.1109/JSAC.1984.1146144
