Title :
VI-8 contactless measurement of minority carrier lifetime in silicon
Author :
White, J.C. ; Unter, T.F. ; Smith, J.G.
fDate :
9/1/1977 12:00:00 AM
Keywords :
Charge carrier lifetime; Infrared detectors; Optical surface waves; Radiation detectors; Radiative recombination; Silicon; Spatial resolution; Spontaneous emission; Surface emitting lasers; Time measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18980
