• DocumentCode
    1059441
  • Title

    Measurement of spectral characteristics of semiconductor laser diodes-effect of injected current modulation and optical feedback

  • Author

    Destrez, Alain ; Toffano, Zeno ; Joindot, Irene ; Birocheau, C. ; Hassine, L.

  • Author_Institution
    Lab. d´´Optoelectron. Service Radioelectricite et Electron. SUPELEC, Gif-sur-Yvette, France
  • Volume
    42
  • Issue
    2
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    304
  • Lastpage
    310
  • Abstract
    Precision optical spectral lineshape measurements on semiconductor lasers using Michelson and Fabry-Perot interferometers are presented. Measurements ranging from 30 MHz up to 100 GHz give the spectral behavior above and below threshold even for very small emitted optical powers. Variations of the linewidth above and below threshold as a function of injected current are measured and used to evaluate the linewidth enhancement factor and behavior at threshold. The lineshape can differ from the modified Schawlow-Townes almost Lorentzian form for semiconductor lasers above threshold when submitted to operating system conditions such as modulation and optical feedback. Under modulation, line frequency and signal form are modified because of chirping effects. A simple method for chirp evaluation at low frequencies based on lineshape evaluation is proposed. Optical feedback effects are studied as a function of the feedback coefficient C showing various regimes differing for single-mode and multimode laser diodes
  • Keywords
    laser variables measurement; light interferometers; modulation spectra; optical modulation; semiconductor lasers; spectral analysis; spectral line breadth; 30 MHz to 100 GHz; Fabry-Perot interferometers; Lorentzian form; Michelson interferometer; chirping effects; feedback coefficient C; injected current modulation; linewidth enhancement factor; multimode laser diodes; optical feedback; optical spectral lineshape measurements; semiconductor laser diodes; single mode laser diode; spectral characteristics; threshold; Chirp modulation; Current measurement; Fabry-Perot interferometers; Frequency; Laser feedback; Operating systems; Optical feedback; Optical interferometry; Semiconductor lasers; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.278571
  • Filename
    278571