DocumentCode
1059441
Title
Measurement of spectral characteristics of semiconductor laser diodes-effect of injected current modulation and optical feedback
Author
Destrez, Alain ; Toffano, Zeno ; Joindot, Irene ; Birocheau, C. ; Hassine, L.
Author_Institution
Lab. d´´Optoelectron. Service Radioelectricite et Electron. SUPELEC, Gif-sur-Yvette, France
Volume
42
Issue
2
fYear
1993
fDate
4/1/1993 12:00:00 AM
Firstpage
304
Lastpage
310
Abstract
Precision optical spectral lineshape measurements on semiconductor lasers using Michelson and Fabry-Perot interferometers are presented. Measurements ranging from 30 MHz up to 100 GHz give the spectral behavior above and below threshold even for very small emitted optical powers. Variations of the linewidth above and below threshold as a function of injected current are measured and used to evaluate the linewidth enhancement factor and behavior at threshold. The lineshape can differ from the modified Schawlow-Townes almost Lorentzian form for semiconductor lasers above threshold when submitted to operating system conditions such as modulation and optical feedback. Under modulation, line frequency and signal form are modified because of chirping effects. A simple method for chirp evaluation at low frequencies based on lineshape evaluation is proposed. Optical feedback effects are studied as a function of the feedback coefficient C showing various regimes differing for single-mode and multimode laser diodes
Keywords
laser variables measurement; light interferometers; modulation spectra; optical modulation; semiconductor lasers; spectral analysis; spectral line breadth; 30 MHz to 100 GHz; Fabry-Perot interferometers; Lorentzian form; Michelson interferometer; chirping effects; feedback coefficient C; injected current modulation; linewidth enhancement factor; multimode laser diodes; optical feedback; optical spectral lineshape measurements; semiconductor laser diodes; single mode laser diode; spectral characteristics; threshold; Chirp modulation; Current measurement; Fabry-Perot interferometers; Frequency; Laser feedback; Operating systems; Optical feedback; Optical interferometry; Semiconductor lasers; Stimulated emission;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.278571
Filename
278571
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