Title :
A Global Simulation of Microwave Emission: Error Structures Based on Output From ECMWF´s Operational Integrated Forecast System
Author :
Holmes, Thomas R H ; Drusch, Matthias ; Wigneron, Jean-Pierre ; De Jeu, Richard A M
Author_Institution :
Vrije Univ., HV Amsterdam
fDate :
3/1/2008 12:00:00 AM
Abstract :
The European Centre for Medium-range Weather Forecasts (ECMWF) brightness will use temperatures from the soil moisture and ocean salinity mission to analyze root zone soil moisture through a variational data assimilation system. The first guess is obtained from numerical weather prediction (NWP) model fields, an auxiliary database, and a land surface microwave emission model. In this paper, we present the community microwave emission model and research the first-guess errors in L-band brightness temperatures. An error propagation study is performed on errors introduced through: (1) uncertainties in the parameterizations of the radiative transfer model; (2) auxiliary geophysical quantities for the radiative transfer computations; and (3) an imperfect NWP model. It is found that the vegetation and dielectric models introduce uncertainties with a difference of up to 25 K between models. However, the biggest error in brightness temperature is likely related to the use of an auxiliary vegetation database, which results in differences of -20 to +20 K in our simulations. These potential errors are in many regions higher than the variance in brightness temperatures related to an imperfect NWP model.
Keywords :
atmospheric radiation; data assimilation; land surface temperature; radiative transfer; soil; vegetation; weather forecasting; Community Microwave Emission Model; ECMWF operational integrated forecast system; European Centre for Medium-range Weather Forecasts; L-band brightness temperature; Soil Moisture and Ocean Salinity mission; land surface microwave emission model; numerical weather prediction; radiative transfer model; root zone soil moisture; variational data assimilation; vegetation; Microwave radiometry; moisture; simulation;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2007.914798