Title :
C-MOS/SOS LSI input/Output protection networks
Author :
Ahlport, Boyce T. ; Cricchi, J. Ronald ; Barth, Douglas A.
Author_Institution :
Northrop Corporation, Electronics Division, Hawthorne, CA
fDate :
8/1/1978 12:00:00 AM
Abstract :
An improved input and output electrical surge protection has been developed for C-MOS and MNOS large-scale integrated circuitry fabricated on sapphire. The failure mode was designed to be the input- or output-series limiting diffused resistor, which can be controlled reliably through the fabrication processes. Forward-bias diodes attenuate the overvoltage surges. Failure energies and voltages have been evaluated, and design equations are developed and verified.
Keywords :
Circuit testing; Conductivity; EMP radiation effects; Impedance; Large scale integration; Resistors; Silicon; Surge protection; Surges; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19204
