DocumentCode :
1060867
Title :
Snap-Through and Pull-In Instabilities of an Arch-Shaped Beam Under an Electrostatic Loading
Author :
Zhang, Yin ; Wang, Yisong ; Li, Zhihong ; Huang, Yubo ; Li, Dachao
Author_Institution :
Chinese Acad. of Sci., Beijing
Volume :
16
Issue :
3
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
684
Lastpage :
693
Abstract :
The snap-through and pull-in instabilities of the micromachined arch-shaped beams under an electrostatic loading are studied both theoretically and experimentally. The pull-in instability that results in a system collision with an electrode substrate may lead to a system failure and, thus, limits the system maximum displacement. The beam/plate structure with a flat initial configuration under an electrostatic loading can only experience the pull-in instability. With the different arch configurations, the structure may experience either only the pull-in instability or the snap-through and pull-in instabilities together. As shown in our computation and experiment, those arch-shaped beams with the snap-through instability have the larger maximum displacement compared with the arch-shaped beams with only the pull-in stability and those with the flat initial configuration. The snap-through occurs by exerting a fixed load, and the structure experiences a discontinuous displacement jump without consuming power. Furthermore, after the snap-through jump, the structures are demonstrated to have the capacity to withstand further electrostatic loading without pull-in. Those properties of consuming no power and increasing the structure deflection range without pull-in is very useful in microelectromechanical systems design, which can offer better sensitivity and tuning range.
Keywords :
electrodes; micromechanical devices; arch-shaped beam; electrode substrate; electrostatic loading; pull-in instabilities; snap-through instabilities; system collision; system maximum displacement; Electrodes; Electrostatic analysis; Fabrication; Instruments; Laboratories; Microelectromechanical systems; Microelectronics; Power system modeling; Springs; Stability; Actuators; beams; electrostatic analysis; modeling;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2007.897090
Filename :
4276827
Link To Document :
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