DocumentCode :
1061008
Title :
The Use of Condition Maps in the Design and Testing of Power Electronic Circuits and Devices
Author :
Bryant, Angus T. ; Parker-Allotey, Nii-Adotei ; Palmer, Patrick R.
Author_Institution :
Warwick Univ., Coventry
Volume :
43
Issue :
4
fYear :
2007
Firstpage :
902
Lastpage :
910
Abstract :
This paper presents a new technique for analyzing the conditions to which power semiconductor devices are subjected within practical inverters. A representative load cycle, which defines the inverter conditions, is used to estimate the switching conditions of the devices. Condition maps are generated, which allows the design and testing of the system to consider the more likely range of conditions. Estimates of temperature profiles can also be made to further improve the realism of such design. This promises to lead to the development of more realistic optimization procedures.
Keywords :
invertors; power semiconductor devices; switching; condition maps; inverters; load cycle; power electronic circuits; power semiconductor devices; switching conditions; Circuit testing; Electronic equipment testing; Inverters; Power electronics; Power semiconductor devices; Power semiconductor switches; Semiconductor device testing; Switching circuits; System testing; Voltage; Conditions; device testing; load cycles; optimization; power semiconductor devices;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2007.900470
Filename :
4276841
Link To Document :
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