Recording properties of multilayered thin film media

Author

Palmer, D.C. ; Johnson, K.E. ; Wu, E.Y. ; Peske, J.V.

Author_Institution

IBM Storage Syst. Products Div., Rochester, MN, USA

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

5307

Lastpage

5309

Abstract

The recording properties of layered film media, including the bit error rate, have been measured for comparison with the results found on single layer film media. This investigation centered on the ability of magnetostatic coupling between layers to affect the magnetic performance in ways other than noise reduction. Multilayered magnetic films were fabricated with interlayer thickness from 25 to 330 Å and with one to six magnetic layers using a CoPtCr alloy on a Cr underlayer. In most tests the single layer media perform better than the multilayer media, but the differences are small and do not appear to influence the error rate significantly. The largest distinguishing feature. is the improvement in the signal-to-noise ratio which comes from two thin layers that are coupled magnetostatically. This leads to an improvement of up to four orders of magnitude in the bit error rate for the bilayer media. Increasing the number of layers gives additional improvement

Keywords

chromium; chromium alloys; cobalt alloys; magnetic disc storage; magnetic recording; magnetic thin films; platinum alloys; sputtered coatings; 25 to 330 angstrom; CoPtCr-Cr layers; bilayer media; bit error rate; interlayer thickness; magnetic performance; magnetic recording properties; magnetostatic coupling; multilayer discs; multilayered thin film media; signal-to-noise ratio; single layer media; sputtered layers; Bit error rate; Chromium alloys; Couplings; Magnetic films; Magnetic recording; Magnetostatics; Noise reduction; Performance evaluation; Testing; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278821

Filename

278821