DocumentCode :
1062639
Title :
Hybrid-SBST Methodology for Efficient Testing of Processor Cores
Author :
Kranitis, Nektarios ; Merentitis, Andreas ; Theodorou, George ; Paschalis, Antonis ; Gizopoulos, Dimitris
Author_Institution :
Univ. of Athens, Athens
Volume :
25
Issue :
1
fYear :
2008
Firstpage :
64
Lastpage :
75
Abstract :
In this article, we introduce a hybrid-SBST methodology for efficient testing of commercial processor cores that effectively uses the advantages of various SBST methodologies. Self-test programs based on deterministic structural SBST methodologies combined with verification-based self-test code development and directed RTPG constitute a very effective H-SBST test strategy. The proposed methodology applies directed RTPG as a supplement to improve overall fault coverage results after component-based self-test code development has been performed.
Keywords :
automatic test pattern generation; logic testing; microprocessor chips; system-on-chip; processor core; random test-program generation; software-based self-test methodology; verification-based self-test code development; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Frequency; Instruction sets; Manufacturing processes; Microprocessors; Semiconductor device testing; Software testing; ATPG; H-SBST; RTPG; computer architecture; functional testing; microprocessor testing; software-based self-test;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.15
Filename :
4447912
Link To Document :
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