Title :
Electrooptic modulation in grain-oriented ZnO films
Author_Institution :
Massachusetts Institute of Technology, Cambridge, MA, USA
fDate :
9/1/1975 12:00:00 AM
Keywords :
Electrodes; Electrooptic modulators; Geometry; Optical attenuators; Optical filters; Resonance; Resonant frequency; Thickness measurement; Voltage; Zinc oxide;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1975.1068883
