Niobium and Tantalum High Q Resonators for Photon Detectors

Author

Barends, R. ; Baselmans, J.J.A. ; Hovenier, J.N. ; Gao, J.R. ; Yates, S.J.C. ; Klapwijk, T.M. ; Hoevers, H.F.C.

Author_Institution

Delft Univ. of Technol., Delft

Volume

17

Issue

2

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

263

Lastpage

266

Abstract

We have measured the quality factors and phase noise of niobium and tantalum coplanar waveguide microwave resonators on silicon. The results of both materials are similar. We reach quality factors up to 10⁵. At low temperatures the quality factors show an anomalous increase, while the resonance frequency remains constant for increasing power levels. The resonance frequency starts to decrease at temperatures around a tenth of the critical temperature. The phase noise exhibits a 1/f like slope. We attribute this behavior to the silicon dielectric.

Keywords

Q-factor; dielectric losses; niobium; phase noise; superconducting photodetectors; superconducting resonators; tantalum; Nb - Interface; Ta - Interface; critical temperature; dielectric losses; niobium phase noise; photon detectors; power levels; quality factors; resonance frequency; silicon dielectric; superconducting resonators; tantalum coplanar waveguide microwave resonators; tantalum high Q resonators; Detectors; Microwave measurements; Niobium; Noise measurement; Phase noise; Q factor; Resonance; Resonant frequency; Silicon; Temperature; Dielectric losses; kinetic inductance; photon detection; superconducting resonators;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2007.898541

Filename

4277287