• DocumentCode
    1065207
  • Title

    SubIslands: the probabilistic match assignment algorithm for subcircuit recognition

  • Author

    Rubanov, Nikolay

  • Author_Institution
    Circuit Semantics Inc., San Jose, CA, USA
  • Volume
    22
  • Issue
    1
  • fYear
    2003
  • fDate
    1/1/2003 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    38
  • Abstract
    The recognition of subcircuit instances in a larger circuit is widely used in the simulation, verification, and testing of integrated circuit computer-aided designs. Subcircuit recognition (SR) can be stated as a problem of finding images of a small model bipartite graph (BG) corresponding to a subcircuit in a large object BG corresponding to a circuit. The best-known SR algorithms are based on the search-oriented subgraph isomorphism methods. Unfortunately, these methods may require a long runtime for large and highly symmetrical circuits. The authors develop a new high-performance probabilistic recognition method for solving the SR problem. This method combines: 1) the graduated assignment matching technique; 2) two well-known concepts from pattern recognition theory, namely, the error propagation and the delayed decision making; and 3) an efficient probabilistic BG labeling algorithm. In contrast to the search-based algorithms, the new recognition method solves the SR problem as an optimization task and, as a consequence, allows extremely fast simultaneous finding of subcircuit images. The experimental results show that this approach recognizes all the subcircuit instances orders of magnitude faster than the search-oriented algorithms.
  • Keywords
    VLSI; circuit CAD; circuit optimisation; circuit simulation; decision making; graph theory; integrated circuit design; pattern recognition; IC computer-aided designs; SubIslands; VLSI design; delayed decision making; error propagation; graduated assignment matching technique; graph labeling; integrated circuit designs; large object bipartite graph; model bipartite graph; optimization method; pattern recognition theory; probabilistic match assignment algorithm; probabilistic recognition method; subcircuit recognition; Bipartite graph; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Design automation; Image recognition; Integrated circuit testing; Runtime; Strontium;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2002.805722
  • Filename
    1158251