DocumentCode
1065349
Title
CMOS compatible high-voltage compliant MESFET-based analogue IC building blocks
Author
Kim, S. ; Lepkowski, W. ; Thornton, T.J. ; Bakkaloglu, B.
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ
Volume
45
Issue
12
fYear
2009
Firstpage
624
Lastpage
626
Abstract
MESFET devices provide high breakdown characteristics, enable high-voltage operation, and direct battery hook-up with no changes in processing on state-of-the-art SOI and SOS CMOS processes. Fundamental analogue building blocks, including single-ended amplifiers and high impedance current mirrors were designed and fabricated in a single poly, three-layer metal digital CMOS technology utilising depletion mode MESFET devices. The SOS MESFETS presented here have a breakdown voltage of over 7.5 V without causing irreversible damage. DC characteristics were measured by varying the power supply from 2.5 to 5.5 V. The measured DC transfer curves of the amplifier show good agreement with the simulated ones with extracted models from the same process. The accuracy of the current mirror showing inverse operation is within 5 for the current from 0 to 1.5 mA with the power supply from 2.5 to 5.5 V.
Keywords
CMOS integrated circuits; MESFET integrated circuits; analogue integrated circuits; digital integrated circuits; CMOS compatible high-voltage compliant; MESFET-based analogue IC building blocks; SOI CMOS process; SOS CMOS process; current 0 mA to 1.5 mA; depletion mode MESFET devices; direct battery hook-up; fundamental analogue building blocks; high impedance current mirrors; high-voltage operation; single poly metal digital CMOS technology; single-ended amplifiers; three-layer metal digital CMOS technology; voltage 2.5 V to 5.5 V;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2009.1130
Filename
5069776
Link To Document