Title :
MP-B5 graded or stepped insulator MIS structures (GI-MIS or SI-MIS)
Author :
DiMaria, D.J. ; Dong, D.W.
fDate :
11/1/1979 12:00:00 AM
Keywords :
Charge carrier processes; Electrodes; Electron traps; FETs; Insulation; MOSFETs; Nonvolatile memory; Random access memory; Read-write memory; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19709
