DocumentCode
10670
Title
Investigating the Intrinsic Noise Limit of Dayem Bridge NanoSQUIDs
Author
Patel, T. ; Li, Bing ; Gallop, J. ; Cox, D. ; Kirkby, K. ; Romans, E. ; Chen, Jiann-Jong ; Nisbet, A. ; Hao, Liangliang
Author_Institution
Nat. Phys. Lab., Teddington, UK
Volume
25
Issue
3
fYear
2015
fDate
Jun-15
Firstpage
1
Lastpage
5
Abstract
NanoSQUIDs made from Nb thin films have been produced with nanometre loop sizes down to 200 nm, using weak-link junctions with dimensions less than 60 nm. These composite (W/Nb) single layer thin film devices, patterned by FIB milling, show extremely good low-noise performance ~170 nΦo at temperatures between 5 and 8.5 K and can operate in rather high magnetic fields (at least up to 1 T) . The devices produced so far have a limited operating temperature range, typically only 1-2 K. We have the goal of achieving operation at 4.2 K, to be compatible with the best SQUID series array (SSA) preamplifier available. Using the SSA to readout the nanoSQUIDs provides us with a means of investigating the intrinsic noise of the former. In this paper we report improved white noise levels of these nanoSQUIDs, enabling potential detection of a single electronic spin flip in a 1-Hz bandwidth. At low frequencies the noise performance is already limited by SSA preamplifier noise.
Keywords
SQUIDs; focused ion beam technology; metallic thin films; milling; niobium; superconducting device noise; superconducting microbridges; Dayem bridge; FIB milling; Nb; SQUID series array; bandwidth 1 Hz; electronic spin flip; intrinsic noise limit; nanoSQUID; temperature 1 K to 2 K; temperature 4.2 K; temperature 5 K to 8.5 K; thin films; weak link junctions; Critical current density (superconductivity); Junctions; Nanoscale devices; Niobium; Noise; Preamplifiers; SQUIDs; $T_{c}$ suppression; NanoSQUIDs; T; noise measurements; suppression;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2014.2364920
Filename
6936295
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