Title :
A Simple Method for Breakdown Voltage Measurements in Thin Films
Author :
Sapieha, S. ; Wertheimer, M.R. ; Yelon, A.
Author_Institution :
Department of Engineering Physics Ecole Polytechnique Montreal, Quebec, Canada
Keywords :
Breakdown voltage; Capacitance; Capacitors; Dielectric breakdown; Dielectric films; Dielectric thin films; Electric breakdown; Instruments; Transistors; Voltage measurement;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1979.298177
