DocumentCode :
1068988
Title :
Status of the GaAs metal—oxide—semiconductor technology
Author :
Mimura, Takashi ; Fukuta, Masumi
Author_Institution :
Fujitsu Laboratories Ltd., Kawasaki, Japan
Volume :
27
Issue :
6
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
1147
Lastpage :
1155
Abstract :
A review of recent and current work on GaAs insulated-gate technology is presented. First, various techniques for the formation of heteromorphic and homomorphic dielectrics are outlined and some important aspects of properties of these dielectrics are reviewed. Second, MOSFET structures, fabrication procedures, and microwave performance are described. Third, the application of GaAs MOSFET´s to digital integrated circuits is summarized.
Keywords :
Capacitance-voltage characteristics; Dielectrics and electrical insulation; Digital integrated circuits; Fabrication; Gallium arsenide; Integrated circuit technology; MOSFET circuits; Oxidation; Paper technology; Plasma temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19998
Filename :
1480791
Link To Document :
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