Title :
Status of the GaAs metal—oxide—semiconductor technology
Author :
Mimura, Takashi ; Fukuta, Masumi
Author_Institution :
Fujitsu Laboratories Ltd., Kawasaki, Japan
fDate :
6/1/1980 12:00:00 AM
Abstract :
A review of recent and current work on GaAs insulated-gate technology is presented. First, various techniques for the formation of heteromorphic and homomorphic dielectrics are outlined and some important aspects of properties of these dielectrics are reviewed. Second, MOSFET structures, fabrication procedures, and microwave performance are described. Third, the application of GaAs MOSFET´s to digital integrated circuits is summarized.
Keywords :
Capacitance-voltage characteristics; Dielectrics and electrical insulation; Digital integrated circuits; Fabrication; Gallium arsenide; Integrated circuit technology; MOSFET circuits; Oxidation; Paper technology; Plasma temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.19998