DocumentCode
1069042
Title
High Field Conduction and Breakdown in Solid Dielectrics
Author
Inuishi, Yoshio
Author_Institution
Faculty of Engineering Osaka University Osaka, Japan
Issue
3
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
139
Lastpage
151
Keywords
Amorphous materials; Breakdown voltage; Charge carrier density; Dielectric breakdown; Dielectrics and electrical insulation; Electrodes; Electron mobility; Electron traps; Solids; Thermal conductivity;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1980.298305
Filename
4080720
Link To Document