Title :
Analysis of the Operational Characteristics of a Resistive SFCL by Using the YBCO Coated Conductor
Author :
Park, Dong Keun ; Yang, Seong Eun ; Yoon, Yong Soo ; Ahn, Min Cheol ; Kim, Ho Min ; Kim, Yeong Sik ; Park, Jung-Wook ; Ko, Tae Kuk
Author_Institution :
Yonsei Univ., Seoul
fDate :
6/1/2007 12:00:00 AM
Abstract :
This paper deals with analysis of the operational characteristics of a resistive non-inductive winding type based superconducting fault current limiter (SFCL) by using YBa2Cu3Oy (YBCO) coated conductor (CC), and its characteristics are analysed through experiments. A non-inductive winding type SFCL system has non-inductive solenoid type coils wound with the YBCO CC and each coil has four windings of the CC in opposite direction to cancel off each inductance, connected in parallel each other. In the experiment, a resistive SFCL was developed and the short circuit test was performed during 0.1 s. The load was pure resistance and the fault switch was closed when a fault occurs. In order to measure the current, shunt resistance was used. A hall sensor was installed in the center of the SFCL to investigate the non-inductivity. The experimental results are given with the theoretical predictions by using finite difference method (FDM). This analysis is expected to be used in the electrical circuit application as well as the SFCL.
Keywords :
barium compounds; conductors (electric); fault current limiters; finite difference methods; high-temperature superconductors; superconducting coils; superconducting magnets; yttrium compounds; YBCO coated conductor; YBa2Cu3Oy; fault switch; finite difference method; non-inductive solenoid type coils; resistive SFCL; resistive non-inductive winding; short circuit test; superconducting fault current limiter; Circuit faults; Circuit testing; Conductors; Fault current limiters; Finite difference methods; Solenoids; Superconducting coils; Switches; Wounds; Yttrium barium copper oxide; Coated conductor; SFCL; YBCO; non-inductive winding;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.897757