Title :
Fracture toughness of Sm123 bulk superconductors evaluated by tensile and bending tests
Author :
Katagiri, Kazumune ; Murakami, Akira ; Okudera, Taichi ; Yoshino, Yasuhiro ; Iwabuchi, Akira ; Noto, Koshichi ; Sakai, Naomichi ; Murakami, Masato
Author_Institution :
Fac. of Eng., Iwate Univ., Morioka, Japan
fDate :
6/1/2004 12:00:00 AM
Abstract :
The effects of test temperature and Sm211 (Sm2BaCuO5) secondary phase particles on the fracture toughness of the Sm123 (SmBa2Cu3Ox) single grain bulk superconductors were investigated by tensile and bending tests using the V-notched specimens. The correlation between the obtained fracture toughness by tensile and bending test was not necessarily good. The fracture toughness obtained by the indentation method was lower than them. The tensile fracture toughness for the crack propagation in the c-axis, 1.2-1.3 MPa m12/, was higher than that in the direction perpendicular to the c-axis, 1.0-1.1 MPa m12/. Although the former increased with increase in the Sm211 molar fraction, the latter did not increase. There was no appreciable difference between the fracture toughness obtained by the tensile tests at LNT and that at RT, while the fracture toughness from the indentation method at LNT was slightly lower than that at RT.
Keywords :
barium compounds; bending strength; cryogenics; fracture toughness; high-temperature superconductors; notch strength; samarium compounds; tensile testing; LNT; RT; Sm123 bulk superconductors; Sm211 molar fraction; Sm211 secondary phase particles; Sm2BaCuO5; SmBa2Cu3O7; V-notched specimens; bending tests; c-axis; crack propagation; cryogenic temperature; fracture toughness; indentation method; single grain bulk superconductors; tensile tests; test temperature; Cryogenics; Laboratories; Magnetic fields; Magnetic materials; Magnetization processes; Materials science and technology; Materials testing; Superconducting materials; Superconductivity; Temperature; Bending test; Sm12; bulk superconductor; cryogenic temperature; tensile test;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2004.830390