Title :
20
Process Development for Superconducting Integrated Circuits With 80 GHz Clock Frequency
Author :
Tolpygo, Sergey K. ; Yohannes, D. ; Hunt, R.T. ; Vivalda, J.A. ; Donnelly, D. ; Amparo, D. ; Kirichenko, A.F.
Author_Institution :
HYPRES Inc., Elmsford
fDate :
6/1/2007 12:00:00 AM
Abstract :
Results of the development of an advanced fabrication process for superconductor integrated circuits (ICs) with 20 kA/cm2 Nb/AlOx/Nb Josephson junctions is presented. The process has 4 niobium superconducting layers, one MoNx resistor layer with 4.0 Ohm per square sheet resistance for the junction shunting and circuit biasing, and employs circular Josephson junctions with the minimum diameter of 1 mum; total 11 photolithography levels. The goal of this process development is the demonstration of the feasibility of 80 GHz clock speeds in superconducting ICs for digital signal processing (DSP) and high performance computing. Basic components of rapid single flux quantum (RSFQ) logic such as DC/SFQ, SFQ/DC converters, Josephson transmission lines (JTLs), and simple digital circuits such as T-flip-flops and 4-bit digital counters have been fabricated and tested. The T-flip-flops were shown to operate up to 400 GHz with the widest margin of operation of plusmn13% at 325 GHz. Digital testing results on the 4-bit counters as well as the junctions, resistors, and other process parameters are also presented. Prospects for yet higher speeds and very large scale integration are discussed.
Keywords :
counting circuits; flip-flops; integrated logic circuits; molybdenum compounds; niobium; photolithography; superconducting device testing; superconducting logic circuits; Josephson junction shunting; MoN; Nb-AlOx-Nb; RSFQ logic; T-flip-flops; circuit biasing; digital signal processing; digital testing; fabrication process development; frequency 325 GHz; frequency 80 GHz; niobium superconducting layers; photolithography level; rapid single flux quantum logic; resistor layer; superconducting integrated circuits; very large scale integration; Circuit testing; Counting circuits; Digital signal processing; Josephson junctions; Logic testing; Niobium; Resistors; Superconducting epitaxial layers; Superconducting integrated circuits; Superconducting transmission lines; Digital integrated circuits; Josephson device fabrication; Josephson junctions; molybdenum nitride; superconducting integrated circuits; toggle-flip-flop;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898571