Title :
MP-A1 technology-induced nonconstant field scaling and its impact on submicro-meter device performance
Author :
Chatterjee, P.K. ; Hunter, W.R. ; Holloway ; Lin, Y.T.
fDate :
11/1/1980 12:00:00 AM
Keywords :
Circuit synthesis; Computer simulation; Electron mobility; FETs; Insulation; Laboratories; Large scale integration; MOSFET circuits; Resistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20176
