Title :
WA-A7 capacitance modeling for SOS transistors
Author :
Pattanayak, Deva N. ; Nelson, James Haydn
fDate :
11/1/1980 12:00:00 AM
Keywords :
Chromium; Crystals; Gallium arsenide; Impurities; Integrated circuit interconnections; Ion implantation; MOSFETs; Parasitic capacitance; Semiconductor device modeling; Silicon compounds;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20228
