Title :
Very low-loss distributed X-band and Ka-band MEMS phase shifters using metal-air-metal capacitors
Author :
Hayden, Joseph S. ; Rebeiz, Gabriel M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
1/1/2003 12:00:00 AM
Abstract :
2-bit wide-band distributed coplanar-waveguide phase shifters have been developed on a 500-μm quartz substrate for X- and Ka-band operation. The designs utilize microelectromechanical system (MEMS) switches in a distributed MEMS transmission line periodically loaded by MEMS switches and high Q (≥250 at 30 GHz) metal-air-metal capacitors. The MEMS switches are actuated by a ±20-V voltage waveform using a high-resistance bias line. Estimated spring constant and switching time is 30 N/m and 9 μs, respectively. The Ka-band 2-bit design results in a reflection coefficient better than -11.5 dB, an average insertion loss of -1.5 dB and phase shifts of 0°, 89°, 180°, and 270° at 37.7 GHz. The X-band 2-bit design results in a reflection coefficient better than -12.5 dB, an average insertion loss of -1.2 dB and phase shifts of 0°, 94°, 176°, and 270° at 13.6 GHz. These results are very competitive with switched transmission-line and reflection-based phase shifters. The distributed design can be easily scaled to V- and W-band frequencies for wide-band low-loss performance.
Keywords :
capacitors; coplanar waveguide components; microswitches; microwave phase shifters; -1.2 dB; -1.5 dB; 13.6 GHz; 2 bit; 20 V; 30 GHz; 37.7 GHz; Ka-band; MEMS switch; SiO2; X-band; bias line; distributed MEMS phase shifter; distributed MEMS transmission line; distributed coplanar waveguide phase shifter; insertion loss; metal-air-metal capacitor; quartz substrate; reflection coefficient; spring constant; switching time; Capacitors; Coplanar transmission lines; Insertion loss; Microelectromechanical systems; Micromechanical devices; Microswitches; Phase shifters; Reflection; Switches; Wideband;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.806520