Title :
On Voltage Acceleration Models of Time to Breakdown—Part I: Experimental and Analysis Methodologies
Author :
Wu, Ernest Y. ; Sune, Jordi
Author_Institution :
Technol. Reliability Dept., IBM Microelectron. Div., Essex Junction, VT
fDate :
7/1/2009 12:00:00 AM
Abstract :
We propose and outline three independent experimental methodologies applicable to the investigation of voltage acceleration models of time to breakdown (T BD) for dielectric breakdown. The self-consistence requirement of voltage acceleration models and Poisson random statistics in terms of area scaling is discussed in detail. Three different T BD acceleration models, which are T BD exponential law (E model), T BD power law, and T BD exponential law of reciprocal voltage and field (1/V model or 1/E model), as widely discussed in literature, are evaluated in the context of these new methodologies. We have found that the T BD exponential law of reciprocal voltage (1/V model) is the best description for the T BD voltage acceleration in the Fowler-Nordheim tunneling regime while the T BD power-law model is the most appropriate in the direct tunneling regime.
Keywords :
Poisson distribution; electric breakdown; reliability; tunnelling; Fowler-Nordheim tunneling; Poisson random statistics; area scaling; dielectric breakdown; exponential law; reliability projection; self-consistence requirement; voltage acceleration models; Acceleration; Breakdown voltage; Context modeling; Dielectric breakdown; Dielectric measurements; Low voltage; Reproducibility of results; Statistics; Stress measurement; Tunneling; Dielectric breakdown; reliability projection; voltage acceleration models;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2009.2021721