Title :
Ionization and Attachment Coefficients in SF6 + N2 Mixtures
Author :
Dincer, M.S. ; Raju, G. R Govinda
Author_Institution :
Department of Electrical Engineering University of Windsor Windsor, Ontario, Canada
Abstract :
Steady-state ionization growth currents have been measured in N2 and SF6 + N2 mixtures in the E/N range of 1.82×101-15 ¿ E/N ¿ 2.58×10-15 V cm2. Least-square analysis is used for the evaluation of apparent ionization, ionization, and attachment coefficients. Experimental E/N limits are observed for several SF6 concentrations in the mixture. The variation of (¿-¿)/N is non-linear with the percnetage mixture ratio.
Keywords :
Current measurement; Dielectric breakdown; Electric variables measurement; Equations; Ionization; Pressure measurement; Steady-state; Sulfur hexafluoride; Vacuum systems; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1984.298731
