DocumentCode :
1073614
Title :
Comparative frequency behavior of GaAs, InP, and GaInAs transferred electron devices—Derivation of a simple comparative criterion
Author :
Rolland, P.A. ; Salmer, G. ; Constant, E. ; Fauquembergue, R.
Author_Institution :
Universite des Sciences et Techniques de Lille 1, Villeneuve d´´Ascq Cedex, France
Volume :
28
Issue :
3
fYear :
1981
fDate :
3/1/1981 12:00:00 AM
Firstpage :
341
Lastpage :
343
Abstract :
A comparison between the intrinsic frequency dependence of transferred electron effects in GaAs, InP, and GaInAs is presented. A simple, comparative, criterion is then derived on the basis of phenomenological Considerations.
Keywords :
Cutoff frequency; Electron mobility; Frequency dependence; Gallium arsenide; Gunn devices; Indium phosphide; Monte Carlo methods; Radio frequency; Semiconductor materials; Steady-state;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20337
Filename :
1481489
Link To Document :
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