• DocumentCode
    1073993
  • Title

    Current Limiting Properties of MOD-YBCO Thin Films Stabilized With High-Resistivity Alloy Shunt Layer

  • Author

    Furuse, M. ; Yamasaki, H. ; Manabe, T. ; Sohma, M. ; Kondo, W. ; Yamaguchi, I. ; Kumagai, T. ; Kaiho, K. ; Arai, K. ; Nakagawa, M.

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba
  • Volume
    17
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    3479
  • Lastpage
    3482
  • Abstract
    Switching power densities of current limiting elements consisting of metal organic deposition YBa2Cu3O7 (MOD-YBCO) thin films with high-resistivity Au-Ag alloy shunt layers and non-inductive Manganin resistors are evaluated. Despite the non-uniform critical current density distribution in MOD-YBCO films, the use of a high-resistivity Au-Ag shunt layer allows MOD-YBCO-based elements to achieve switching power densities comparable to those obtained for elements based on co-evaporated YBCO thin films. The present MOD-YBCO-based elements are capable of withstanding electric fields of 46 V/cm with a switching power density of 2.0 kVA/cm2. These results indicate that low cost MOD-YBCO thin films are promising for practical fault current limiters. In addition, relationships between the uniformity of Jc distribution and current limiting properties are also discussed.
  • Keywords
    MOCVD; barium compounds; critical current density (superconductivity); electrical resistivity; fault current limiters; gold alloys; high-temperature superconductors; silver alloys; superconducting thin films; thin film resistors; yttrium compounds; AuAg-YBa2Cu3O7; MOD-YBCO thin films; coevaporated thin films; current limiting property; high-resistivity alloy shunt layers; metal organic deposition; noninductive Manganin resistors; nonuniform critical current density; switching power density; Costs; Current limiters; High temperature superconductors; Resistors; Shunt (electrical); Sputtering; Superconducting films; Superconducting transmission lines; Transistors; Yttrium barium copper oxide; Fault current limiter; YBCO thin film; metal organic deposition; shunt layer;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.898349
  • Filename
    4278094