DocumentCode :
1074423
Title :
Electrical conduction and degradation mechanisms in powder ZnS:Mn, Cu direct current electroluminescent devices
Author :
Abdalla, Mohamed I. ; Godin, Annick ; Brenac, Alain ; Noblanc, Jean-pierre
Author_Institution :
GTE Laboratories, Inc., Waltham, MA
Volume :
28
Issue :
6
fYear :
1981
fDate :
6/1/1981 12:00:00 AM
Firstpage :
689
Lastpage :
693
Abstract :
The electrical properties and degradation mechanisms in direct current electroluminescent (dc EL) ZnS: Mn,Cu powder devices have been investigated. The electrical characteristics of degraded devices were found to be substantially different from freshly prepared devices. The degradation mechanisms were explored by scanning electron microscopy (SEM) and it was found that the layer close to the positive electrode had undergone modifications due to Cu ion migration. The equivalent circuit is also analyzed and the effect of degradation on the values of its parameters is examined. Finally, a method to improve the maintenance characteristics is described.
Keywords :
Circuit analysis; Degradation; Electric variables; Electrodes; Electroluminescent devices; Equivalent circuits; Mechanical factors; Powders; Scanning electron microscopy; Zinc compounds;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20413
Filename :
1481565
Link To Document :
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