DocumentCode :
1074494
Title :
A Novel  {\\rm x} -ploiting Strategy for Improving Performance of Test Data Compression
Author :
Yi, Maoxiang ; Liang, Huaguo ; Zhang, Lei ; Zhan, Wenfa
Author_Institution :
Dept. of Electron. Sci. & Technol., Hefei Univ. of Technol., Hefei, China
Volume :
18
Issue :
2
fYear :
2010
Firstpage :
324
Lastpage :
329
Abstract :
A precomputed core test set contains a large number of don´t cares (x´s) that can be effectively exploited to improve test data compression (TDC). Extending pattern run-length coding, we present a novel strategy that propagates the x´s of a reference pattern to a new reference pattern in such a way that the reference pattern is xor-ed with the pattern to be encoded. The x -propagating strategy can increase the probability of a reference pattern being coding-compatible with the pattern to be encoded, and its validity can be established by filling some x´s of the already encoded patterns in backtracing way. How our strategy is used for TDC is demonstrated. Experimental results for large ISCAS89 benchmarks show that, compared to the recently proposed schemes, our technique can effectively improve compression and simplify on-chip decoder, and work better when used for core-unified TDC.
Keywords :
data compression; pattern recognition; runlength codes; core test set; pattern run-length coding; reference pattern; test data compression; x-ploiting strategy; $ x$-propagating; $x$-filling; Backtracing; test data compression (TDC);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2009873
Filename :
5075520
Link To Document :
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