Title :
RF planar ferromagnetic inductors on silicon
Author :
Viala, B. ; Royet, A.S. ; Cuchet, R. ; Aïd, M. ; Gaud, P. ; Valls, O. ; Ledieu, M. ; Acher, O.
Author_Institution :
Lab. d´´Electronique et Technol. de 1´´Inf., Comissariat a l´´Energie Atomique, Grenoble, France
fDate :
7/1/2004 12:00:00 AM
Abstract :
Two-port coplanar ferromagnetic inductors using solid magnetic planes were fabricated on silicon. L, R, and Q measurements are presented. Cutoff frequencies exceed 10 GHz, indicating no capacitance limitation. The increase in L over the air-core value is ∼15%, and the quality factor Q is of ∼10 up to 1.5 GHz. The inductance scales with HA-alignment and spiral excitation ratio. Agreement with High-Frequency Structure Simulator simulations including ferromagnetic resonance led to a better understanding in terms of L and Q. Current increase in L is limited by the film thickness (0.2 μm). Thicker films (0.5-1 μm) would lead to larger gain over L (23% to 31%) with similar Q (∼10). The restriction in Q from the air-core inductor consists in magnetic losses but not only. Another contribution would come from anomalous ohmic losses from the spiral itself enhanced by the proximity of the magnetic planes.
Keywords :
elemental semiconductors; ferromagnetic materials; ferromagnetic resonance; inductors; radiofrequency integrated circuits; silicon; HA-alignment; RF planar ferromagnetic inductors; air-core inductor; air-core value; capacitance limitation; coplanar ferromagnetic inductors; cutoff frequencies; ferromagnetic resonance; film thickness; inductance scales; magnetic losses; ohmic losses; quality factor; radio-frequency circuits; silicon; solid magnetic planes; spiral excitation ratio; Capacitance; Cutoff frequency; Inductors; Magnetic films; Q factor; Q measurement; Radio frequency; Silicon; Solids; Spirals; CoZrNb; RF; circuits; inductors; quality factor; radio-frequency;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832486