DocumentCode :
1075357
Title :
Generation and detection of picosecond electric pulses with freely positionable photoconductive probes
Author :
Pfeifer, Torsten ; Heiliger, Hanns-Michael ; Roskos, Hartmut G. ; Kurz, Heinrich
Author_Institution :
Inst. fur Halbleitertech. II, Tech. Hochschule Aachen, Germany
Volume :
43
Issue :
12
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
2856
Lastpage :
2862
Abstract :
Two different kinds of external photoconductive probes are investigated in detail. Their dual character in application as generators or detectors of picosecond electric transients is demonstrated. The probes are manufactured on transparent silicon-on-sapphire substrates suitable for on-wafer testing of integrated circuits. A detailed analysis of the freely positionable probes is performed in time domain with respect to linearity, sensitivity, time resolution and invasiveness
Keywords :
high-speed optical techniques; integrated circuit testing; photoconducting devices; probes; pulse generators; submillimetre wave measurement; transient analysers; Al2O3; Si-Al2O3; Si-on-sapphire substrates; electro optically detected pulses; freely positionable photoconductive probes; invasiveness; linearity; on-wafer IC testing; optoelectronic measurement; picosecond electric pulse detection; picosecond electric pulse generation; picosecond electric transients; sensitivity; time domain analysis; time resolution; ultrafast electric signals; Character generation; Circuit analysis; Circuit testing; Detectors; Integrated circuit manufacture; Integrated circuit testing; Performance analysis; Photoconductivity; Probes; Pulse generation;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.475646
Filename :
475646
Link To Document :
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