Title :
L10 Fe-Pt on nanocrystalline HITPERM soft magnetic underlayer for perpendicular recording media
Author :
Kumar, S. ; Roy, Anup G. ; Laughlin, David E.
Author_Institution :
Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
Fe-Pt films with [002] perpendicular orientation have been prepared on HITPERM soft magnetic underlayers. Subsequent to preparing the HITPERM underlayer film at room temperature, Cr seed layers (20-80 nm), Pt buffer layers (∼3 nm), and Fe-Pt recording layers (8-30 nm) were sputter-deposited in-situ over a range of temperatures. The desired Cr [200] texture was obtained at ∼250-280°C. With the Cr seed layer [200] oriented, thick (80 nm) Cr films were seen to promote [002] orientation in thick (30 nm) Fe-Pt films, whereas thin (20 nm) Cr films promoted better [002] texture in thin (8 nm) Fe-Pt films. In the as-deposited state, the Fe-Pt films exhibited incomplete ordering to the L10 phase. Structural studies performed on these films, as well as domain images obtained from the HITPERM soft magnetic underlayer films, will be presented here.
Keywords :
crystal orientation; ferromagnetic materials; nanostructured materials; perpendicular magnetic recording; soft magnetic materials; sputter deposition; surface texture; 20 to 80 nm; 250 to 280 C; 8 to 30 nm; Fe-Pt; HITPERM underlayer film; as-deposited state; buffer layers; domain images; film structures; in situ sputter deposition; nanocrystalline HITPERM; perpendicular orientation; perpendicular recording media; recording layers; seed layers; soft magnetic underlayer; Amorphous magnetic materials; Chromium; Magnetic anisotropy; Magnetic domains; Magnetic films; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Saturation magnetization; Soft magnetic materials; Sputtering; Fe-Pt; perpendicular recording; soft underlayers;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832464