DocumentCode
1076294
Title
VIB-6 measurement of submicron potential barriers in depleted base transistors
Author
Stork, J.M.C. ; Plummer, James D.
Volume
28
Issue
10
fYear
1981
fDate
10/1/1981 12:00:00 AM
Firstpage
1262
Lastpage
1263
Keywords
Computer simulation; Doping; Electric variables; Electric variables measurement; Geometry; Integrated circuit measurements; Laboratories; MOSFETs; Temperature measurement; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20594
Filename
1481746
Link To Document