DocumentCode
1076331
Title
Visual Servo Control Achieving Nanometer Resolution in
–
–
Author
Kim, Jung H. ; Menq, Chia-Hsiang
Author_Institution
Lam Res. Corp., Fremont, CA
Volume
25
Issue
1
fYear
2009
Firstpage
109
Lastpage
116
Abstract
This paper presents a three-axis vision motion sensor and its applications to visual servo control. The vision sensor is integrated with a three-axis piezo stage to form a visual servo control system that achieves nanometer resolution in all three x- y-z motion axes. Motion measurement is achieved using a single interferometer-equipped optical microscope. A real-time image-processing algorithm that processes interference fringe patterns and that achieves nanometer out-of-plane resolution is presented. Furthermore, a feedback-control scheme is introduced to control the sensor plane using an Objective-Z-Positioner to enable automatic tracking of moving objects. It expands the out-of-plane measurement range of the vision sensor beyond its inherent depth of field of several micrometers to 100 mum and beyond. An integrated visual servo system is implemented and experimental results are shown.
Keywords
feedback; interferometers; motion control; motion measurement; optical microscopes; position control; servomechanisms; Objective-Z-Positioner; feedback-control scheme; interferometer-equipped optical microscope; motion measurement; nanometer resolution; three-axis vision motion sensor; visual servo control; Fringe pattern; interferometry; laterally sampled white light interferometry (L-SWLI); motion measurement; optical microscope; visual servo control; white light interferometry (WLI);
fLanguage
English
Journal_Title
Robotics, IEEE Transactions on
Publisher
ieee
ISSN
1552-3098
Type
jour
DOI
10.1109/TRO.2008.2003267
Filename
4757222
Link To Document