DocumentCode :
1076686
Title :
High efficiency inversion layer solar cells on polycrystalline silicon by the application of silicon nitride
Author :
Schorner, Reinhold ; Hezel, R. ; Hezel, Rudolf
Author_Institution :
Universität Erlangen-Nürnberg, Erlangen, West Germany
Volume :
28
Issue :
12
fYear :
1981
fDate :
12/1/1981 12:00:00 AM
Firstpage :
1466
Lastpage :
1469
Abstract :
Plasma enhanced CVD silicon nitride is introduced for the fabrication of inversion layer solar cells on p-type polycrystalline silicon. The same high interface quality as obtained for Si-nitride on monocrystalline silicon could also be achieved for polycrystalline silicon. This includes high interface charge densities up to 6.6 × 1012cm-2and high UV sensitivity of the cells. For 4-cm2polycrystalline metal-insulator-semiconductor inversion layer (MIS/IL) solar cells active area efficiencies up to 13.4 percent (12.3-percent total area efficiency) under AM1 illumination could be reached, the highest values yet reported for polycrystalline silicon inversion layer solar cells on a total area basis. For the coprocessed MIS/IL cells on monocrystalline 0.7-ω. cm p-Si
Keywords :
Coatings; Crystallization; Lighting; Metal-insulator structures; Photovoltaic cells; Plasma applications; Semiconductor films; Silicon; Stability; Surface resistance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20631
Filename :
1481783
Link To Document :
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