• DocumentCode
    1077779
  • Title

    Low-leakage, high-efficiency, reliable VPE InGaAs 1.0-1.7 µm photodiodes

  • Author

    Olsen, G.H.

  • Author_Institution
    RCA Laboratories, Princeton, NJ
  • Volume
    2
  • Issue
    9
  • fYear
    1981
  • fDate
    9/1/1981 12:00:00 AM
  • Firstpage
    217
  • Lastpage
    219
  • Abstract
    High-quality InGaAs vapor-grown photodetectors for the 1.0-1.7 µm spectral region with a 100 µm diameter active area, ∼10-30 nA leakage current, 65-75 V breakdown voltage, 60-80% quantum efficiency, < 0.5 ns pulse rise time, < 1 pW/Hz1/2noise equivalent power and stable leakage current at 60°C for over 4000 hours are described.
  • Keywords
    Avalanche breakdown; Coatings; Detectors; Gold; Indium gallium arsenide; Indium phosphide; Leakage current; Photodiodes; Reflectivity; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1981.25409
  • Filename
    1481893