DocumentCode
1077779
Title
Low-leakage, high-efficiency, reliable VPE InGaAs 1.0-1.7 µm photodiodes
Author
Olsen, G.H.
Author_Institution
RCA Laboratories, Princeton, NJ
Volume
2
Issue
9
fYear
1981
fDate
9/1/1981 12:00:00 AM
Firstpage
217
Lastpage
219
Abstract
High-quality InGaAs vapor-grown photodetectors for the 1.0-1.7 µm spectral region with a 100 µm diameter active area, ∼10-30 nA leakage current, 65-75 V breakdown voltage, 60-80% quantum efficiency, < 0.5 ns pulse rise time, < 1 pW/Hz1/2noise equivalent power and stable leakage current at 60°C for over 4000 hours are described.
Keywords
Avalanche breakdown; Coatings; Detectors; Gold; Indium gallium arsenide; Indium phosphide; Leakage current; Photodiodes; Reflectivity; Temperature;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1981.25409
Filename
1481893
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