DocumentCode :
1078210
Title :
The Aging Process in Electrical Insulation: A Tutorial Summary
Author :
G. Alleb, Peter H. ; Tustin, Arnold
Author_Institution :
Department of Electrical Engineering, Imperial College of Science and Technology, London, England
Issue :
3
fYear :
1972
Firstpage :
153
Lastpage :
157
Abstract :
Calculating the life expectancy of electrical insulation is an interesting application of Arrhenius´s law. Bussing´s analytical treatment is derived for the simple case of life at constant temperature. Its extension to variable temperature conditions is explained as is the application of the same techniques to calculating mechanical failure due to creep and capacitor failure due to electrode diffusion. Lastly, recently developed techniques for rapid determination of the slopes of Arrhenius´s-law graphs for insulation life are reviewed.
Keywords :
Aging; Capacitors; Chemical processes; Creep; Dielectrics and electrical insulation; Electrical engineering; Electrodes; Insulation life; Temperature dependence; Tutorial;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1972.299199
Filename :
4081713
Link To Document :
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