• DocumentCode
    1078693
  • Title

    Silicon-based packaging platform for light-emitting diode

  • Author

    Tsou, Chingfu ; Huang, Yu-Sheng

  • Author_Institution
    Dept. of Autom. Control Eng., Feng Chia Univ., Taichung
  • Volume
    29
  • Issue
    3
  • fYear
    2006
  • Firstpage
    607
  • Lastpage
    614
  • Abstract
    A novel concept of silicon-based packaging platform with microreflector and embedded electrode-guided interconnections was development for a package component of a light-emitting diode (LED). TracePro and ANSYS software were respectively used to understand the optical and thermal characteristics of the package component. Simulation results show the microreflector at several certain specific dimensions can be used to achieve high brightness, and the carrier made of silicon wafer compared with that of aluminum stage can minimize the thermal stresses caused by mismatch of thermal expansion coefficient. The novel packaging platform was fabricated by silicon bulk micromachining and solder reflow techniques. Various solutions in fabricating embedded solder interconnections were explored to accomplish the electrode-guided interconnections. Experimental results show the method using solder paste reflow can achieve better yield and performance. The electrical resistances of such solder interconnections with the height of 100 mum were measured to be less than 5 Omega. As such, this technique can be applied broadly in packaging for conventional optoelectronic semiconductor devices such as laser diodes and image sensors
  • Keywords
    electronics packaging; interconnections; light emitting diodes; micromachining; reflow soldering; silicon; ANSYS software; TracePro; bulk micromachining; embedded electrode-guided interconnections; light-emitting diode; microreflectors; silicon substrate; silicon-based packaging platform; solder interconnections; solder reflow techniques; thermal expansion coefficient; thermal stress; Brightness; Light emitting diodes; Optical devices; Optical interconnections; Optical sensors; Packaging; Silicon; Software packages; Thermal expansion; Thermal stresses; Bulk micromachining; light-emitting diode (LED) package; silicon substrate; thermal stress;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2006.875409
  • Filename
    1667882