• DocumentCode
    1079331
  • Title

    Effect of Random Circuit Fabrication Errors on Small-Signal Gain and Phase in Traveling-Wave Tubes

  • Author

    Pengvanich, Phongphaeth ; Chernin, David ; Lau, Y.Y. ; Luginsland, John W. ; Gilgenbach, Ronald M.

  • Author_Institution
    Univ. of Michigan, Ann Arbor
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    916
  • Lastpage
    924
  • Abstract
    Motivated by current interest in submillimeter and terahertz (THz) slow-wave vacuum electronic amplifiers, which employ miniature, difficult-to-manufacture slow-wave circuits, we evaluate the effects of small random fabrication errors on the small-signal characteristics of a traveling wave tube. The classical 1-D small-signal theory of Pierce, generalized to allow axially varying circuit characteristics, is applied. Random, axially varying perturbations are introduced in the circuit phase velocity mismatch , the gain parameter , and the cold-tube circuit loss , in Pierce notation. Results from a first-order perturbation analysis of the small-signal equations, which are confirmed by numerical analysis, show that the standard deviations in the output phase and in the small-signal gain are linearly proportional to the standard deviations of the individual perturbations in , , and . Our study confirms that the effects of perturbations in the circuit phase velocity dominate the effects of perturbations in and .
  • Keywords
    travelling wave amplifiers; travelling wave tubes; first-order perturbation analysis; random circuit fabrication error; slow-wave vacuum electronic amplifier; small-signal gain; traveling-wave tube; Broadband communication; Circuits; Electron beams; Electron tubes; Electronic warfare; Equations; Fabrication; Manufacturing processes; Numerical analysis; Radar; Manufacturing tolerance; statistical variation; traveling-wave tube (TWT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.914840
  • Filename
    4455790