• DocumentCode
    1081065
  • Title

    Toward a model-based Bayesian theory for estimating and recognizing parameterized 3-D objects using two or more images taken from different positions

  • Author

    Cernuschi-Frias, Bruno ; Cooper, David B. ; Hung, Yi-ping ; Belhumeur, Peter N.

  • Author_Institution
    Div. of Eng., Brown Univ., Providence, RI, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1028
  • Lastpage
    1052
  • Abstract
    A parametric modeling and statistical estimation approach is proposed and simulation data are shown for estimating 3-D object surfaces from images taken by calibrated cameras in two positions. The parameter estimation suggested is gradient descent, though other search strategies are also possible. Processing image data in blocks (windows) is central to the approach. After objects are modeled as patches of spheres, cylinders, planes and general quadrics-primitive objects, the estimation proceeds by searching in parameter space to simultaneously determine and use the appropriate pair of image regions, one from each image, and to use these for estimating a 3-D surface patch. The expression for the joint likelihood of the two images is derived and it is shown that the algorithm is a maximum-likelihood parameter estimator. A concept arising in the maximum likelihood estimation of 3-D surfaces is modeled and estimated. Cramer-Rao lower bounds are derived for the covariance matrices for the errors in estimating the a priori unknown object surface shape parameters
  • Keywords
    Bayes methods; parameter estimation; pattern recognition; picture processing; statistical analysis; 3D object surface recognition; Bayesian theory; maximum likelihood estimation; parameter estimation; parametric modeling; pattern recognition; picturing processing; statistical estimation; Bayesian methods; Cameras; Estimation theory; Image recognition; Maximum likelihood estimation; Motion estimation; Parameter estimation; Robot vision systems; Surface reconstruction; Surface treatment;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.42835
  • Filename
    42835