DocumentCode
1081065
Title
Toward a model-based Bayesian theory for estimating and recognizing parameterized 3-D objects using two or more images taken from different positions
Author
Cernuschi-Frias, Bruno ; Cooper, David B. ; Hung, Yi-ping ; Belhumeur, Peter N.
Author_Institution
Div. of Eng., Brown Univ., Providence, RI, USA
Volume
11
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
1028
Lastpage
1052
Abstract
A parametric modeling and statistical estimation approach is proposed and simulation data are shown for estimating 3-D object surfaces from images taken by calibrated cameras in two positions. The parameter estimation suggested is gradient descent, though other search strategies are also possible. Processing image data in blocks (windows) is central to the approach. After objects are modeled as patches of spheres, cylinders, planes and general quadrics-primitive objects, the estimation proceeds by searching in parameter space to simultaneously determine and use the appropriate pair of image regions, one from each image, and to use these for estimating a 3-D surface patch. The expression for the joint likelihood of the two images is derived and it is shown that the algorithm is a maximum-likelihood parameter estimator. A concept arising in the maximum likelihood estimation of 3-D surfaces is modeled and estimated. Cramer-Rao lower bounds are derived for the covariance matrices for the errors in estimating the a priori unknown object surface shape parameters
Keywords
Bayes methods; parameter estimation; pattern recognition; picture processing; statistical analysis; 3D object surface recognition; Bayesian theory; maximum likelihood estimation; parameter estimation; parametric modeling; pattern recognition; picturing processing; statistical estimation; Bayesian methods; Cameras; Estimation theory; Image recognition; Maximum likelihood estimation; Motion estimation; Parameter estimation; Robot vision systems; Surface reconstruction; Surface treatment;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.42835
Filename
42835
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