Title :
Improved Core Isolation and Access for Hierarchical Embedded Test
Author :
Nadeau-Dostie, Benoit ; Adham, Saman M I ; Abbott, Russell
Author_Institution :
LogicVision, SanJose, CA
Abstract :
IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.
Keywords :
automatic testing; integrated circuit testing; system-on-chip; IEEE Std 1500; SoC; automated test development system; hierarchical embedded test; improved core isolation; Assembly; Automatic testing; Built-in self-test; Circuit testing; Concurrent engineering; Design methodology; Integrated circuit testing; Logic design; Logic testing; System testing; IEEE Std 1500; TAP; WSP; core isolation; embedded test; hierarchical test; shared isolation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.13
