Title :
An integration scheme for image segmentation and labeling based on Markov random field model
Author :
Kim, Il.Y. ; Yang, Hyun S.
Author_Institution :
Micro Devices Business, Samsung Electronics Co. Ltd., Buchun, South Korea
fDate :
1/1/1996 12:00:00 AM
Abstract :
This paper presents a unified approach for the image understanding problem based on the Markov random field models. In the proposed scheme, the image segmentation and interpretation processes cooperate in the simultaneous optimization process so that the erroneous segmentation and misinterpretation can be compensatedly recovered by continuous estimation of the unified energy function
Keywords :
Markov processes; computer vision; image recognition; image segmentation; optimisation; Markov random field model; image interpretation; image labeling; image recognition; image segmentation; image understanding; optimization; region clustering; unified energy function; Computer vision; Graphics; Image processing; Image recognition; Image segmentation; Labeling; Layout; Markov random fields; Pattern analysis; Robots;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
