DocumentCode :
1082851
Title :
Profile simulation of negative resist MRS using the SAMPLE photolithography simulator
Author :
Matsuzawa, T. ; Kishimoto, A. ; Tomioka, H.
Author_Institution :
Central Research Laboratory, Tokyo, Japan
Volume :
3
Issue :
3
fYear :
1982
fDate :
3/1/1982 12:00:00 AM
Firstpage :
58
Lastpage :
60
Abstract :
The profile simulation of a negative deep UV resist, MRS (micro-resist for shorter wavelengths), is realized by application of the SAMPLE photolithography process simulator developed on the basis of the modeling of AZ-type positive photoresists. The absence of swelling permits MRS to use the same simulation algorithm as AZ-type resists. Two exposure parameters (A and B) successfully represent the intense light absorption of MRS, and the simulation traces the development process to show the unique undercut profile of MRS.
Keywords :
Absorption; Deformable models; Helium; Inhibitors; Laboratories; Lithography; Polymers; Printing; Resins; Resists;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1982.25478
Filename :
1482583
Link To Document :
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