• DocumentCode
    108361
  • Title

    Analytical Approach to Design of Proportional-to-the-Absolute-Temperature Current Sources and Temperature Sensors Based on Heterojunction Bipolar Transistors

  • Author

    Golovins, E. ; Sinha, S.

  • Author_Institution
    Dept. of Electr., Electron. & Comput. Eng., Univ. of Pretoria, Pretoria, South Africa
  • Volume
    3
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    262
  • Lastpage
    274
  • Abstract
    Embedded temperature sensors based on proportional-to-the-absolute-temperature (PTAT) current sources have the potential to lay the foundation for low-cost temperature-aware integrated circuit architectures if they meet the requirements of miniaturization, fabrication process match, and precise estimation in a wide range of temperatures. This paper addresses an analytical approach to the minimum-element PTAT circuit design capitalizing on the physics-based modeling of the heterojunction bipolar transistor (HBT) structures. It is shown that a PTAT circuit can be implemented on only two core HBT elements with good accuracy. Derived parametric relations allow a straightforward specification of the thermal gain at the design stage, which affects sensor sensitivity. Further derived current-to-temperature mapping expresses a temperature estimate based on the measured PTAT output current. Numerical examples indicate attainable estimation accuracy of 0.43% in case of a measurement instance taken in the absence of measurement noise.
  • Keywords
    constant current sources; heterojunction bipolar transistors; integrated circuit design; temperature sensors; HBT structures; PTAT current sources; current-to-temperature mapping; design stage; embedded temperature sensors; fabrication process match; heterojunction bipolar transistor structures; low-cost temperature-aware integrated circuit architectures; measurement noise; minimum-element PTAT circuit design; physics-based modeling; precise estimation; proportional-to-the-absolute-temperature current sources; sensor sensitivity; temperature estimation; thermal gain; Heterojunction bipolar transistors; Integrated circuit modeling; Temperature distribution; Temperature measurement; Temperature sensors; Bi-complementary metal–oxide–semiconductor (BiCMOS) integrated circuits; bipolar transistors; heterojunction; temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2226886
  • Filename
    6397587