Title :
A technique for noise measurements of SIS receivers
Author :
Ke, Qing ; Feldman, M.J.
Author_Institution :
Dept. of Electr. Eng., Rochester Univ., NY, USA
fDate :
4/1/1994 12:00:00 AM
Abstract :
We present a simple new technique to determine the noise temperature of the RF input section of a superconducting quasiparticle heterodyne receiver. This quantity is difficult to measure by existing methods. The new technique uses standard hot/cold-load measurements, and the precision should be as good as the hot/cold-load determination of receiver noise temperature. For most receivers, correction terms will be much smaller than the quantum temperature hω/k
Keywords :
electric noise measurement; electron device noise; electron device testing; microwave measurement; mixers (circuits); receivers; superconducting junction devices; superconducting microwave devices; MM-wave devices; RF input section; SIS receivers; hot/cold-load measurements; noise measurements; noise temperature; superconducting quasiparticle heterodyne receiver; 1f noise; Bandwidth; Integrated circuit noise; Integrated circuit technology; Microwave theory and techniques; Niobium; Noise measurement; Optical noise; Optical receivers; Superconducting device noise;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
