Title :
Experimental characterization of the nonlinear behavior of RF amplifiers
Author :
Rolain, Yves ; Van Moer, Wendy ; Pintelon, Rik ; Schoukens, Johan
Author_Institution :
Electr. Meas. Dept., Vrije Univ., Brussels
Abstract :
Using specifically designed broadband periodic random excitation signals, the best linear approximation of RF amplifiers is measured. The proposed technique: 1) takes into account the measurement uncertainty and the nonlinear distortions and 2) detects, quantifies, and classifies the nonlinear distortions with confidence bounds. The approach is suitable for the experimental characterization of existing amplifiers
Keywords :
approximation theory; measurement uncertainty; nonlinear distortion; nonlinear network analysis; radiofrequency amplifiers; random processes; RF amplifiers; confidence bounds; excitation signals; linear approximation; measurement uncertainty; microwave amplifier; nonlinear behavior characterization; nonlinear distortions; Linear approximation; Multiaccess communication; Nonlinear distortion; Nonlinear systems; OFDM; Performance evaluation; RF signals; Radio frequency; Radiofrequency amplifiers; US Government; Linear approximation; linear characteristics; microwave amplifier; nonlinear distortions; system identification;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2006.879168
