• DocumentCode
    1084897
  • Title

    An optical angle of attack sensor

  • Author

    McDevitt, T. Kevin ; Owen, F. Kevin

  • Author_Institution
    Complere Inc., Palo Alto, CA, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1990
  • Firstpage
    19
  • Lastpage
    27
  • Abstract
    A major source of transonic and supersonic wind-tunnel test data uncertainty are angle-of-attack-measurement errors caused by unknown sting and balance deflections under load. Since dynamic loads in pressurized or cryogenic wind tunnels generally exceed those in conventional low-speed atmospheric wind tunnels, the need to account for these distortions during model testing is even more acute. A novel laser-based instrument for the in-situ measurement of wind-tunnel-model angle of attack that enables continuous, time-dependent measurements to be made without signal dropout is described. Proof-of-concept experiments, along with the results of recent measurements conducted at the NASA Ames 9-ft*7-ft supersonic wind tunnel, are presented. Experiments were also conducted to determine the reliable range, sensitivity, and long-term stability of the instrument. The results show that 0.01 degrees sensitivity can be achieved and that optical and detector packaging requirements are less stringent than those for current tilt-sensor or accelerometer model installations.<>
  • Keywords
    low-temperature techniques; measurement by laser beam; nonelectric sensing devices; wind tunnels; NASA; angle-of-attack-measurement errors; calibration; cryogenic wind tunnels; distortions; dynamic loads; in-situ measurement; long-term stability; optical angle of attack sensor; packaging; pressurised wind tunnel; sensitivity; supersonic wind-tunnel; time-dependent measurements; transonic wind tunnel; Adaptive optics; Atmospheric measurements; Atmospheric modeling; Cryogenics; Distortion measurement; Instruments; Optical distortion; Optical sensors; Testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.50842
  • Filename
    50842